Complete tests for displacing faults of circuit entries / E. V. Morozov. // Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika. 2015. № 1. P. 55-59 [Moscow Univ. Math. Bulletin. Vol. 72, N 2, 2017. P. 37-40].

The paper is focused on faults of circuit inputs such that the output value of fault circuits depends only on correct inputs. It is shown that the Shannon function of the length of the detecting test for such faults is equal to 2n-\log_2{n}+O(\log_2{\log_2{n}}) and the Shannon function of the length of the diagnostic test is asymptotically equal to 2^n.

Key words: Boolean function, Shannon function, tests.